Re: [TCML] IGBT paralleling/Cosmic event burnout

["Peter Terren" <pterren@xxxxxxxxxxxx>]

Seems ironic that the same process that causes longer lightning strikes 
(relativistic electrons from cosmic ray events) is the cause of SSTC 
mischief resulting in shorter TC sparks for the same silicon.

Peter
tesladownunder.com

----- Original Message ----- 
From: "David Sharpe" <sparktron01@xxxxxxxxx>
.....  Further,
if you run more then 75% of device maximum ratings
as DC applied can result in the dreaded SEBO
(Single Event Burn-out) failure.

The "Single Event" alluded to above is ionizing radiation
in the form of random Cosmic Radiation, which can
result in catastrophic avalanche failure of the device.
The first generation French TGV Electric Traction
Locomotives exhibited frequent failures that were finally
determined to be caused by this phenomenon.  It has
likewise been determined that ionizing radiation including
energetic neutrons can precipitate this type of failure.
........
"When applied voltage is >200V, use 50% de-rating to
protect against SEB(O) / SEGR".
.............
You may elect to "push" the ratings of your solid-state
devices in your particular application, but you do so at
your device and systems PERIL.

Regards
Dave Sharpe, TCBOR/HEAS
Chesterfield, VA. USA




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